Single-length method used to determine the dielectric constant of polydimethylsiloxane

IEEE Transactions on Microwave Theory and Techniques

Volumn 56, Issue 12, 2008, Pages 2963-2971

  Farcich, Nick J ^a   Salonen, Jaakko ^b   Asbeck, Peter M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

Broadband de embedding; Complex permittivity; Dielectric constant; Polydimethylsiloxane (PDMS); Propagation constant; Single length method; Sylgard 182

Indexed keywords

CERAMIC CAPACITORS; DIELECTRIC MATERIALS; DIELECTRIC WAVEGUIDES; ELECTRIC LINES; FIXTURES (TOOLING); MICROCHANNELS; SILICONES; TELECOMMUNICATION SYSTEMS; ULTRASHORT PULSES;

BROADBAND DE-EMBEDDING; COMPLEX PERMITTIVITY; DIELECTRIC CONSTANT; PROPAGATION CONSTANT; SINGLE-LENGTH METHOD; SYLGARD 182;

PERMITTIVITY;

EID: 57849102554     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2008.2007182     Document Type: Conference Paper

References (16)

1. W. B. Wier, "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, vol. 62, no. 1, pp. 33-36, Jan. 1974.
2. G. F. Engen and C. A. Hoer, "Thru-reflect line: An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Trans. Microw. Theory Tech., vol. MTT-27, no. 12, pp. 987-993, Dec. 1979.
3. J. Baker-Jarvis, E. J. Vanzura, and W. A. Kissick, "Improved technique for determining complex permittivity with the transmission/reflection method," IEEE Trans. Microw. Theory Tech., vol. 38, no. 8, pp. 1096-1103, Aug. 1990.
4. J. Drupka and C. Weil, "Recent advances in metrology for the electromagnetic characterization of materials at microwave frequencies," in Proc. MIKON, Krakow, Poland, May 20-22, 1998, pp. 243-253.
5. M.N. Afsar, J. R. Birch, and R. N. Clarke, "Measurement of the properties of materials," Proc. IEEE, vol. 74, no. 1, pp. 183-199, Jan. 1996.
6. R. B. Marks, "A multiline method of network analyzer calibration," IEEE Trans. Microw. Theory Tech., vol. 39, no. 7, pp. 1205-1215, Jul. 1991.
7. M. Lee and S. Nam, "An accurate broadband measurement of substrate dielectric constant," IEEE Microw. Guided Wave Lett., vol. 6, no. 4, pp. 168-170, Apr. 1996.
8. M. D. Janezic and J. A. Jargon, "Complex permittivity determination from propagation constant measurements," IEEE Microw. Guided Wave Lett., vol. 9, no. 2, pp. 76-78, Feb. 1999.
9. J. A. Reynoso-Hernandz, C. F. Estrada-Maldonado, T. Perra, K. Grenier, and J. Graffeuil, "An improved method for the wave propagation constant estimation in broadband uniform millimeter-wave transmission line," Microw. Opt. Technol. Lett., vol. 22, no. 4, pp. 268-271, Aug. 20, 1999.
10. N. L. Jeon, J. Hu, G. M. Whitesides, M. K. Erhardt, and R. G. Nuzzo, "Fabrication of silicon MOSFETs using soft lithography," Adv. Mater., vol. 10, no. 17, pp. 1466-1469, Jan. 1999.
11. N. Bowden, W. T. S. Huck, K. E. Paul, and G. M. Whitesides, "The controlled formation of ordered, sinusoidal structures by plasma oxidation of an elastomeric polymer," Appl. Phys. Lett., vol. 75, no. 17, pp. 2557-2559, Oct. 25, 1999.
12. D. C. Duffy, O. J. A. Schueller, S. T. Brittain, and G. M. Whitesides, "Rapid prototyping of microfluidic switches in poly(dimethhylsiloxane) and their actuation by electro-osmotic flow," J. Micromech. Microeng., vol. 9, pp. 211-217, 1999.
13. R. E. Collin, Foundations of Microwave Engineering. New York: McGraw-Hill, 1966.
14. "Dow Corning information bulletin," Dow Coming, Midland, MI [Online]. Available: http://www.dowcorning.com
15. A. J. Bur, "Dielectric properties of polymers at microwave frequencies: A review," Polymer, vol. 26, pp. 963-977, Jul. 1985.
16. B. Riddle, J. Baker-Jarvis, and J. Krupka, "Complex permittivity measurements of common plastics over variable temperatures," IEEE Trans. Microw. Theory Tech., vol. 51, no. 3, pp. 727-733, Mar. 2003.