A new calibration-independent method for complex permittivity extraction of solid dielectric materials

IEEE Microwave and Wireless Components Letters

Volumn 18, Issue 12, 2008, Pages 788-790

  Hasar, Ugur Cem ^a,b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York at Binghamton   (United States)

Author keywords

Calibration; Permittivity measurement; Scattering parameters measurement

Indexed keywords

CALIBRATION; DIELECTRIC MATERIALS; PERMITTIVITY; PERMITTIVITY MEASUREMENT;

COMPLEX PERMITTIVITIES; COMPLEX PERMITTIVITY DETERMINATIONS; IN HOMOGENEITIES; NONRESONANT; PARAMETER MEASUREMENTS; SCATTERING PARAMETERS MEASUREMENT;

EXTRACTION;

EID: 57349132902     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2008.2007699     Document Type: Article

References (15)

1. R. Zoughi, Microwave Non-Destructive Testing and Evaluation. Dordrecht, The Netherlands: Kluwer, 2000.
2. L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, and V. K. Varadan, Microwave Electronics: Measurement and Materials Characterization. New York: Wiley, 2004.
3. M. Q. Lee and S. Nam, "An accurate broadband measurement of substrate dielectric constant," IEEE Microw. Guided Wave Lett., vol. 6, no. 4, pp. 168-170, Apr. 1996.
4. M. D. Janezic and J. A. Jargon, "Complex permittivity determination from propagation constant measurements," IEEE Microw. Guided Wave Lett., vol. 9, no. .1, pp. 76-78, Feb. 1999.
5. I. Huygen, C. Steukers, and F. Duhamel, "A wideband line-line dielectrometric method for liquids, soils, and planar substrates," IEEE Trans. Instrum. Meas., vol. 50, no. 5, pp. 1343-1348, Oct. 2001.
6. C. Wan, B. Nauwelaers, W. De Raedt, and M. Van Rossum, "Two new measurement methods for explicit determination of complex permittivity," IEEE Trans. Microw. Theory Tech., vol. 46, no. 11, pp. 1614-1619, Nov. 1998.
7. K.-H. Baek, H.-Y. Sung, and W. S. Park, "A 3-position transmission/ reflection method for measuring the permittivity of low loss materials," IEEE Microw. Guided Wave Lett., vol. 5, no. 1, pp. 3-5, Jan. 1995.
8. C. Wan, B. Nauwelaers, W. De Raedt, and M. Van Rossum, "Complex permittivity measurement method based on asymmetry of reciprocal two-ports," Electron. Lett., vol. 32, no. 16, p. 1497, Aug. 1996.
9. U. C. Hasar, "Calibration-independent method for complex permittivity determination of liquid and granular materials," Electron. Lett., vol. 44, no. 9, pp. 585-586, Apr. 2008.
10. G. F. Engen and C. A. Hoer, "'Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Microw. Theory Tech., vol. MTT-27, no. 1, 2, pp. 987-993, Dec. 1, 979.
11. G. Strang, Linear Algebra and Its Applications. New York: Academic, 1976.
12. W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes in C: The Art of Scientific Computing. New York: Cambridge Univ. Press, 1992.
13. U. C. Hasar, "Two novel amplitude-only methods for complex permittivity determination of medium- and low-loss materials," Meas. Sei. TechoL, vol. 19, no. 5, pp. 55706-55715, May 2008.
14. A. H. Boughriet, C. Legrand, and A. Chapoton, "A noniterative stable transmission/reflection method for low-loss material complex permittivity determination," IEEE. Trans. Microw. Theory Tech., vol. 45, no. 1, pp. 52-57, Jan. 1997.
15. G. Y. Chin and E. A. Mechtly, "Properties of materials," in Reference Data for Engineering: Radio, Electronics, Computer, and Communications, E. C. Jordan, Ed. Indianapolis, IN: Howard W. Sams & Co., 1,986, pp. 4-20-4-21.