An accurate broadband measurement of substrate dielectric constant

IEEE Microwave and Guided Wave Letters

Volumn 6, Issue 4, 1996, Pages 168-170

  Lee, Moon Que ^b   Nam, Sangwook ^a,b  

^a IEEE

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CALCULATIONS; ELECTRIC IMPEDANCE; ELECTRIC VARIABLES MEASUREMENT; ERRORS; MATHEMATICAL TRANSFORMATIONS; MATRIX ALGEBRA; PERMITTIVITY; SUBSTRATES; TRANSMISSION LINE THEORY;

ACCURATE BROADBAND MEASUREMENT; CHARACTERISTIC IMPEDANCE; TRANSMISSION REFLECTION METHOD;

MICROSTRIP LINES;

EID: 0030128492     PISSN: 10518207     EISSN: None     Source Type: Journal    
DOI: 10.1109/75.481077     Document Type: Article

References (3)

1. W. B. Weir, "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, vol. 62, no. 1, pp. 33-36, Jan. 1974
2. A. Enders, "An accurate measurement technique for line properties, junction effects, and dielectric and magnetic material parameters," IEEE Trans. Microwave Theory Tech., vol. 37, no. 3, pp. 589-605, July 1989.
3. N. K. Das, S. M. Voda, and D. M. Pozar, "Two method for the measurement of substrate dielectric constant," IEEE Trans. Microwave Theory Tech., vol. MTT-35, no. 7, pp. 636-641, July 1987.