A calibration-independent microwave method for position-insensitive and nonsingular dielectric measurements of solid materials

Journal of Physics D: Applied Physics

Volumn 42, Issue 7, 2009, Pages

  Hasar, U C ^a,b   Simsek, O ^a  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CELL LOCATIONS; COMPLEX PERMITTIVITIES; DIELECTRIC MEASUREMENTS; ELECTRICAL PROPERTIES; INDEPENDENT MEASUREMENTS; MEASUREMENT CELLS; MICROWAVE METHODS; PLEXIGLAS; PROPAGATION CONSTANTS; SCATTERING PARAMETER MEASUREMENTS; SELF-CHECKING; SINGULARITY POINTS; SOLID MATERIALS;

CALIBRATION; CHLORINE COMPOUNDS; ELECTRIC PROPERTIES; EXTRACTION; MATERIALS PROPERTIES; MEASUREMENTS; MICROWAVES; PERMITTIVITY; POLYVINYL CHLORIDES; UNCERTAINTY ANALYSIS;

DIELECTRIC MATERIALS;

EID: 63749127937     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/7/075403     Document Type: Article

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