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Volumn 38, Issue C, 2001, Pages 355-445

5. High-pressure surface science

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Indexed keywords


EID: 77956789809     PISSN: 10794042     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1079-4042(01)80052-7     Document Type: Article
Times cited : (16)

References (277)
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    • (1995) Microprobe Techniques in the Earth Sciences , pp. 387
    • Roberts, S.1    Beattie, I.2
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    • (1999) Properties of Crystalline Silicon , pp. 104
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    • (1973) The Raman Effect , vol.2 , pp. 95
    • Cowley, R.A.1
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    • Willardson R.K., and Beer A.C. (Eds), Academic Press, New York
    • Lannin J.S. In: Willardson R.K., and Beer A.C. (Eds). Semiconductors and Semimetals Vol. 21 (1984), Academic Press, New York 159
    • (1984) Semiconductors and Semimetals , vol.21 , pp. 159
    • Lannin, J.S.1
  • 152
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    • Homan C., Macone R.K., and Whaley E. (Eds), North-Holland, New York
    • Huang T., and Ruoff A.L. In: Homan C., Macone R.K., and Whaley E. (Eds). Proc. of 9th AIPAPT Conf. Vol. 22 (1984), North-Holland, New York 37
    • (1984) Proc. of 9th AIPAPT Conf. , vol.22 , pp. 37
    • Huang, T.1    Ruoff, A.L.2
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    • de With G., Terpstra R.A., and Metselaar R. (Eds), Elsevier Appl. Sci., London and New York
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    • (1989) Properties of Ceramics , vol.2
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    • (1987) High-Pressure Research in Mineral Physics , pp. 347
    • Hemley, R.J.1


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