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Journal of Materials Research

Volumn 15, Issue 8, 2000, Pages 1754-1758

Size-dependent phase transformations during point loading of silicon

(4) Mann, A B a Van Heerden, D a Pethica, J B b Weihs, T P a

a Johns Hopkins University (United States)

b UNIVERSITY OF OXFORD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INDENTATION; INTERFACES (MATERIALS); PHASE TRANSITIONS; SHEAR STRESS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

INTERFACIAL EFFECTS;

SILICON;

EID: 0034256158 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2000.0253 Document Type: Article

Times cited : (94)

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