Lattice-distortion-induced amorphization in indented [110] silicon

Journal of Materials Research

Volumn 14, Issue 3, 1999, Pages 682-687

  Wu, Y Q ^a   Xu, Y B ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; CRYSTAL LATTICES; INTERFACES (MATERIALS); TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

LATTICE-DISTORTION-INDUCED AMORPHIZATION; VICKER'S INDENTATION TESTING;

AMORPHOUS SILICON;

EID: 0033101221     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1999.0093     Document Type: Article

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