Phase transformations during microcutting tests on silicon

Applied Physics Letters

Volumn 69, Issue 19, 1996, Pages 2870-2872

  Tanikella, B V ^a   Somasekhar, A H ^a   Sowers, A T ^b   Nemanich, R J ^b   Scattergood, R O ^a  

^a North Carolina State University   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000185668     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117346     Document Type: Article

References (20)

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