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Volumn 87, Issue 3, 2000, Pages 1280-1283

Raman characterization of structural disorder and residual strains in micromachined GaAs

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001750505     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372009     Document Type: Article
Times cited : (31)

References (24)
  • 19
    • 85037513433 scopus 로고    scopus 로고
    • Université Paul Sabatier, 118 route de Narbonne, 31062 Toulouse, France
    • Software developed by P. Puech and G. Landa, Laboratoire de Physique des Solides, Université Paul Sabatier, 118 route de Narbonne, 31062 Toulouse, France.
    • Laboratoire de Physique des Solides
    • Puech, P.1    Landa, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.