Laser-combined scanning tunnelling microscopy for probing ultrafast transient dynamics

Journal of Physics Condensed Matter

Volumn 22, Issue 26, 2010, Pages

  Terada, Yasuhiko ^a   Yoshida, Shoji ^a   Takeuchi, Osamu ^a   Shigekawa, Hidemi ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LEVELS; ELECTROMAGNETIC WAVELENGTHS; FEMTOSECOND RANGE; NANO SCALE; NEW TECHNOLOGIES; PHYSICAL QUANTITIES; QUANTUM FUNCTIONS; REAL-SPACE; SCANNING TUNNELLING MICROSCOPY; SCIENTIFIC RESEARCHES; SPATIAL RESOLUTION; SPATIO-TEMPORAL RESOLUTION; TIME RESOLUTION; TIME-RESOLVED SCANNING; TRANSIENT DYNAMICS; TRANSIENT PHENOMENON; ULTRA-FAST; ULTRAFAST LASER TECHNOLOGY; ULTRASHORT OPTICAL PULSE;

SCANNING TUNNELING MICROSCOPY;

ARTICLE; EQUIPMENT DESIGN; INSTRUMENTATION; KINETICS; LASER; METHODOLOGY; NANOTECHNOLOGY; QUANTUM THEORY; SCANNING TUNNELING MICROSCOPY; TIME;

EQUIPMENT DESIGN; KINETICS; LASERS; MICROSCOPY, SCANNING TUNNELING; NANOTECHNOLOGY; QUANTUM THEORY; TIME FACTORS;

EID: 77955976156     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/22/26/264008     Document Type: Article

References (50)

1. Shinada T, Okamoto S, Kobayashi T and Ohdomari I 2005 Nature 437 1128
2. Othonos A 1998 J. Appl. Phys. 83 1789 and references therein
3. Shah J 1999 Ultrafast Spectroscopy of Semiconductors and Semiconductor Nanostructures (Berlin: Springer) and references therein
4. Hagen A, Steiner M, Raschke M B, Lienau C, Hertel T, Qian H, Meixner A J and Hartschuh A 2005 Phys. Rev. Lett. 95 197401
5. Levy J, Nikitin V, Kikkawa J M, Cohen A, Samarth N, Garcia R and Awschalom D D 1996 Phys. Rev. Lett. 76 1948
6. Cadby A, Khalil G, Fox A M and Lidzey D G 2008 J. Appl. Phys. 103 093715
7. Nechay B A, Siegner U, Morier-Genoud F, Schertel A and Keller U 1999 Appl. Phys. Lett. 74 61
8. Schmidt O, Bauer M, Wiemann C, Porath R, Scharte M, Andreyev O, Schönhense G and Aeschlimann M 2002 Appl. Phys. B 74 223
9. Kubo A, Pontius N and Petek H 2007 Nano Lett. 7 470
10. Schönhense G 2004 J. Electron. Spectrosc. Relat. Phenom. 137-140 769
11. Oelsner A, Krasyuk A, Nepijko S, Schneider C M and Schönhense G 2005 J. Electron. Spectrosc. Relat. Phenom. 144-147 771
12. Bauer M, Wiemann C, Lange J, Bayer D, Rohmer M and Aeschlimann M 2007 Appl. Phys. A 88 473
13. Meyer zu Heringdorf F-J, Chelaru L I, Möllenbeck S, Thien D and Horn-von Hoegen M 2007 Surf. Sci. 601 4700
14. Rohmer M, Ghaleh F, Aeschlimann M, Bauer M and Hövel H 2007 Eur. Phys. J. D 45 491
15. King W E, Campbell G H, Frank A, Reed B, Schmerge J F, Siwick B J, Stuart B C and Weber P M 2005 J. Appl. Phys. 97 111101 and references therein
16. Barwick B, Park S, Kwon O-H, Baskin J S and Zewail A H 2008 Science 322 1227
17. Dömer H and Bostanjoglo O 2003 Rev. Sci. Instrum. 74 4369
18. LaGrange T, Armstrong M R, Boyden K, Brown C G, Campbell G H, Colvin J D, DeHopeW J, Frank A M, Gibson D J, Hartemann F V, Kim J S, King W E, Pyke B J, Reed B W, Shirk M D, Shuttlesworth R M, Stuart B C, Torralva B R and Browning N D 2006 Appl. Phys. Lett. 89 044105
19. Reed B W, Armstrong M R, Browning N D, Campbell G H, Evans J E, LaGrange T and Masiel D J 2009 Microsc. Microanal. 15 272
20. Gahlmann A, Park S T and Zewail A H 2008 Phys. Chem. Chem. Phys. 10 2894
21. Mamin H J, Birk H, Wimmer P and Rugar D 1994 J. Appl. Phys. 75 161
22. Wintterlin J, Trost J, Renisch S, Schuster R, Zambelli T and Ertl G 1997 Surf. Sci. 394 159
23. Rost M J, Crama L, Schakel P, van Tol E, van Velzen-Williams G B E M, Overgauw C F, ter Horst G, Dekker H, Okhuijsen B, Seynen M, Vijftigschild A, Han P, Katan A J, Schoots K, Schumm R, van Loo W, Oosterkamp T H and Frenken J W M 2005 Rev. Sci. Instrum. 76 053710
24. Petersen L, Schunack M, Schaefer B, Linderoth T R, Rasmussen P B, Sprunger P T, Laegsgaard E, Stensgaard I and Besenbacher F 2001 Rev. Sci. Instrum. 72 1438
25. Kemiktarak U, Ndukum T, Schwab K C and Ekinci K L 2007 Nature 450 85
26. Takeuchi O, Morita R, Yamashita M and Shigekawa H 2002 Japan. J. Appl. Phys. 41 4994
27. Takeuchi O, Aoyama M, Oshima R, Okada Y, Oigawa H, Sano N, Shigekawa H, Morita R and Yamashita M 2004 Appl. Phys. Lett. 85 3268
28. Takeuchi O, Aoyama M and Shigekawa H 2005 Japan. J. Appl. Phys. 44 5354
29. Takeuchi O, Aoyama M, Kondo M, Taninaka A, Terada Y and Shigekawa H 2006 Japan. J. Appl. Phys. 45 1926
30. Terada Y, Aoyama M, Kondo H, Taninaka A, Takeuchi O and Shigekawa H 2007 Nanotechnology 18 044028
31. Shigekawa H, Yoshida S, Takeuchi O, Aoyama M, Terada Y, Kondo H and Oigawa H 2008 Thin Solid Films 516 2348
32. Shigekawa H, Takeuchi O and Aoyama M 2005 Sci. Technol. Adv. Mater. 6 582
33. Binnig G, Rohrer H, Gerber Ch and Weibel E 1982 Phys. Rev. Lett. 49 57
34. Grafström S 2002 J. Appl. Phys. 91 1717 and references therein
35. Weiss S, Ogletree D F, Botkin D, Salmeron M and Chemla D S 1993 Appl. Phys. Lett. 63 2567
36. Keil U D, Jensen J R and Hvam J M 1998 Appl. Phys. Lett. 72 1644
37. Botkin D, Glass J, Chemla D S, Ogletree D F, Salmeron M and Weiss S 1996 Appl. Phys. Lett. 69 1321
38. Groeneveld R H M and van Kempen H 1996 Appl. Phys. Lett. 69 2294
39. Nunes G Jr and Freeman M R 1993 Science 262 1029
40. Steeves G M, Elezzabi A Y and Freeman M R 1997 Appl. Phys. Lett. 70 1909
41. Khusnatdinov N N, Nagle T J and Nunes G Jr 2000 Appl. Phys. Lett. 77 4434
42. Hamers R J and Cahill D G 1990 Appl. Phys. Lett. 57 2031
43. Hamers R J and Cahill D G 1991 J. Vac. Sci. Technol. B 9 514
44. Grafström S, Schuller P, Kowalski J and Nuemann R 1998 J. Appl. Phys. 83 3435
45. Gerstner V, Knoll A, PfeifferW, Thon A and Gerber G 2000 J. Appl. Phys. 88 4851
46. Jersch J, Demming F, Fedotov I and Dickmann K 1999 Appl. Phys. A 68 637
47. Pfeiffer W, Sattler F, Vogler S, Gerber G, Grand J-Y and Möller R 1997 Appl. Phys. B 64 265
48. Terada Y, Yoshida S, Takeuchi O and Shigekawa H 2010 at press
49. Yoshida S, Kikuchi J, Takeuchi O, Oigawa H and Shigekawa H 2006 e-J. Surf. Sci. Nanotech. 4 192
50. Yoshida S, Kanitani Y, Oshima R, Okada Y, Takeuchi O and Shigekawa H 2007 Phys. Rev. Lett. 98 026802