Nonlinear dependences in pulse-pair-excited scanning tunneling microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 3 B, 2006, Pages 1926-1930

  Takeuchi, Osamu ^a   Aoyama, Masahiro ^a   Kondo, Hiroyuki ^a   Taninaka, Atsushi ^a   Terada, Yasuhiko ^a   Shigekawa, Hidemi ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Femtosecond pulsed laser; Scanning tunneling microscopy; Ultrafast mesurement

Indexed keywords

ELECTRIC CURRENTS; LASER PULSES; ULTRAFAST PHENOMENA;

FEMTOSECOND PULSED LASERS; TUNNEL CURRENTS; ULTRAFAST MESUREMENT;

SCANNING TUNNELING MICROSCOPY;

EID: 33645529210     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.1926     Document Type: Article

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