A fast-scanning, low- and variable-temperature scanning tunneling microscope

Review of Scientific Instruments

Volumn 72, Issue 2, 2001, Pages 1438-1444

  Petersen, L ^a   Schunack, M ^a   Schaefer, B ^a   Linderoth, T R ^a   Rasmussen, P B ^a   Sprunger, P T ^a,b   Laegsgaard, E ^a   Stensgaard, I ^a   Besenbacher, F ^a  

^a AARHUS UNIVERSITY   (Denmark)

^b LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035247160     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1337068     Document Type: Article

References (32)

1. G. Binnig and H. Rohrer, Rev. Mod. Phys. 59, 615 (1987), and references therein.
2. M. Bott, T. Michely, and G. Comsa, Rev. Sci. Instrum. 66, 4135 (1995).
3. X. Chen, E. R. Frank, and R. J. Hamers, Rev. Sci. Instrum. 65, 3373 (1994).
4. G. Meyer, Rev. Sci. Instrum. 67, 2960 (1996).
5. B. C. Stipe, M. A. Rezaei, and W. Ho, Rev. Sci. Instrum. 70, 137 (1999).
6. M. Kugler, C. Renner, O. Fischer, V. Mikheev, and G. Batey, Rev. Sci. Instrum. 71, 1475 (2000).
7. M. A. Dubson and J. S. Hwang, Rev. Sci. Instrum. 63, 3643 (1992).
8. J. H. Ferris, J. G. Kushmerick, J. A. Johnson, M. G. Y. Youngquist, R. B. Kessinger, H. F. Kingsbury, and P. S. Weiss, Rev. Sci. Instrum. 69, 2691 (1998).
9. S. Horch, P. Zeppenfeld, R. David, and G. Comsa, Rev. Sci. Instrum. 65, 3204 (1994).
10. W. W. Crew and R. J. Madix, Rev. Sci. Instrum. 66, 4552 (1995).
11. S. Behler, M. K. Rose, J. C. Dunphy, D. F. Ogletree, M. Salmeron, and C. Chapelier, Rev. Sci. Instrum. 68, 2479 (1997).
12. E. Laegsgaard, F. Besenbacher, M. Mortensen, and I. Stensgaard, J. Mierosc. 152, 663 (1988).
13. E. Laegsgaard et al. (unpublished).
14. G. Binnig and H. Rohrer, Surf. Sci. 126, 236 (1983).
15. National Electrostatics Corporation, http://pelletron.com.
16. R. David, K. Kern, P. Zeppenfeld, and G. Comsa, Rev. Sci. Instrum. 57, 2771 (1986).
17. Goodfellow, http://www.goodfellow.com.
18. American Institute of Physics Handbook, edited by D. E. Gray (McGraw-Hill, New York, 1972).
19. The Technical Glass Company, http://www.technicalglass.co.uk.
20. G. Binnig and D. P. E. Smith, Rev. Sci. Instrum. 57, 1688 (1986).
21. Staveley NDT Technologies, http://www.staveleyndt.com.
22. R. M. Feenstra and M. A. Lutz, J. Vac. Sci. Technol. B 9, 716 (1991).
23. K. J. Ito, Y. Uehara, S. Ushioda, and K. Ito, Rev. Sci. Instrum. 71, 420 (2000).
24. K. Morgenstern, G. Rosenfeld, E. Lægsgaard, F. Besenbacher, and G. Comsa, Phys. Rev. Lett. 80, 556 (1998).
25. L. Petersen, B. Schaefer, E. Lægsgaard, I. Stensgaard, and F. Besenbacher, Surf. Sci. 457, 319 (2000).
26. M. F. Crommie, C. P. Lutz, and D. M. Eigler, Nature (London) 363, 524 (1993).
27. Y. Hasegawa and P. Avouris, Phys. Rev. Lett. 71, 1071 (1993).
28. J. Tersoff and D. R. Hamann, Phys. Rev. B 31, 805 (1985).
29. L. Petersen et al., Phys. Rev. B 57, R6858 (1998).
30. L. Petersen, Ph. Hofmann, E. W. Plummer, and F. Besenbacher, J. Electron Spectros. Relat. Phenom. 109, 97 (2000).
31. J. K. Gimzewski, C. Joachim, R. R. Schlittler, V. Langlais, H. Tang, and I. Johannsen, Science 281, 531 (1998).
32. M. Schunack, L. Petersen, A. Kühnle, E. Lægsgaard, I. Stensgaard, and F. Besenbacher, Phys. Rev. Lett. 86, 456 (2001).