The capacitive origin of the picosecond electrical transients detected by a photoconductively gated scanning tunneling microscope

Applied Physics Letters

Volumn 69, Issue 15, 1996, Pages 2294-2296

  Groeneveld, R H M ^a   Van Kempen, H ^a  

^a RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000266883     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117538     Document Type: Article

References (10)

1. M. R. Freeman and G. Nunes, Jr., Appl. Phys. Lett. 63, 2633 (1993).
2. G. Nunes, Jr. and M. R. Freeman, Science 262, 1028 (1993).
3. S. Weiss, D. F. Ogletree, D. Botkin, M. Salmeron, and D. S. Chemla, Appl. Phys. Lett. 63, 2567 (1993).
4. K. Takeuchi and Y. Kasahara, Appl. Phys. Lett. 63, 3548 (1993).
5. S. Weiss, D. Botkin, D. F. Ogletree, M. Salmeron, and D. S. Chemla, Phys. Status Solidi B 188, 343 (1995).
6. D. Botkin, S. Weiss, D. F. Ogletree, J. Beeman, M. Salmeron, and D. S. Chemla, Rev. Sci. Instrum. 66, 4130 (1995).
7. R. H. M. Groeneveld, Th. Rasing, L. M. F. Kaufmann, E. Smallbrugge, J. H. Wolter, M. R. Melloch, and H. van Kempen, Physica B 218, 294 (1996); J. Vac. Sci. Technol. B 14, 861 (1996).
8. R. H. M. Groeneveld, Th. Rasing, L. M. F. Kaufmann, E. Smallbrugge, J. H. Wolter, M. R. Melloch, and H. van Kempen, Physica B 218, 294 (1996); J. Vac. Sci. Technol. B 14, 861 (1996).
9. See, for example, J. van Bladel, Electromagnetic Fields (McGraw-Hill, New York, 1964).
10. R. H. M. Groeneveld and H. van Kempen (unpublished).