Advances in ultrafast scanning tunneling microscopy

Applied Physics Letters

Volumn 69, Issue 9, 1996, Pages 1321-1323

  Botkin, D ^a   Glass, J ^c   Chemla, D S ^c   Ogletree, D F ^b   Salmeron, M ^b   Weiss, S ^b  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000266882     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117581     Document Type: Article

References (17)

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