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Volumn 85, Issue 15, 2004, Pages 3268-3270

Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ELECTRIC CURRENT MEASUREMENT; GALLIUM NITRIDE; SCANNING TUNNELING MICROSCOPY; THERMAL EXPANSION; TUNNEL JUNCTIONS;

EID: 8644241749     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1804238     Document Type: Article
Times cited : (49)

References (15)
  • 15
    • 8644222875 scopus 로고    scopus 로고
    • Since space is limited, details about the signal analysis will be shown elsewhere
    • Since space is limited, details about the signal analysis will be shown elsewhere.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.