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Volumn 85, Issue 15, 2004, Pages 3268-3270
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Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
AMPLIFIERS (ELECTRONIC);
ELECTRIC CURRENT MEASUREMENT;
GALLIUM NITRIDE;
SCANNING TUNNELING MICROSCOPY;
THERMAL EXPANSION;
TUNNEL JUNCTIONS;
CURRENT SIGNALS;
PUMP-PROBE REFLECTIVITY MEASUREMENTS;
TUNNELING CURRENTS;
ULTRASHORT PULSES;
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EID: 8644241749
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1804238 Document Type: Article |
Times cited : (49)
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References (15)
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