Modeling local electrical fluctuations in 45 nm heavily pocket-implanted bulk MOSFET

Solid-State Electronics

Volumn 54, Issue 11, 2010, Pages 1359-1366

  Mezzomo, Cecilia M ^a,b   Bajolet, Aurelie ^a   Cathignol, Augustin ^c   Josse, Emmanuel ^a   Ghibaudo, Gérard ^b  

^a STMICROELECTRONICS   (France)

^b IMEP LAHC   (France)

^c IBM   (France)

Author keywords

Extraction; Fluctuations; Matching; Mismatch; Pocket; Random dopants; Variability

Indexed keywords

FLUCTUATIONS; MATCHING; MISMATCH; POCKET; RANDOM DOPANTS; VARIABILITY;

DOPING (ADDITIVES);

TRANSISTORS;

EID: 77955659343     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2010.06.010     Document Type: Article

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