Reconfigurable Special Test Circuit of physics-based IGBT models parameter extraction

Solid-State Electronics

Volumn 54, Issue 11, 2010, Pages 1246-1256

  Rodríguez, Marco A ^a   Claudio, Abraham ^b   Cotorogea, Maria ^b   González, Leobardo H ^b,c   Aguayo, Jesús ^b  

^a UNIVERSIDAD AUTÓNOMA DEL CARMEN   (Mexico)

^b CENTRO NACIONAL DE INVESTIGACIÓN Y DESARROLLO TECNOLÓGICO   (Mexico)

^c INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

Author keywords

Electrical measurements; IGBT model; Parameter extraction; Special Test Circuit

Indexed keywords

DEVICE PHYSICS; ELECTRICAL MEASUREMENT; FREQUENCY RANGES; IGBT MODELS; PHYSICS-BASED; PHYSICS-BASED MODELS; POWER ELECTRONIC DEVICES; POWER SEMICONDUCTOR DEVICES; RE-CONFIGURABLE; SIMULATION SOFTWARE; STRUCTURAL PARAMETER; SWITCHING LOSS; TEST CIRCUIT; TEST SETUPS;

CIRCUIT SIMULATION; COMPUTER SOFTWARE; ELECTRIC VARIABLES MEASUREMENT; ELECTRON DEVICES; MODELS; PARAMETER EXTRACTION; POWER ELECTRONICS; SEMICONDUCTOR DEVICE MANUFACTURE; TESTING;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

EID: 77955653803     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2010.06.019     Document Type: Article

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