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Volumn 2005, Issue , 2005, Pages 679-684

A FEM punch-through IGBT model using an efficient parameter extraction method

Author keywords

[No Author keywords available]

Indexed keywords

AMBIPOLAR DIFFUSION EQUATION (ADE); FINITE ELEMENT PHYSICS; PARAMETER EXTRACTION;

EID: 33749664128     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2005.1568986     Document Type: Conference Paper
Times cited : (4)

References (22)
  • 6
    • 0036641777 scopus 로고    scopus 로고
    • Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model
    • P. M. Igic, P. A. Mawby, M. S. Towers, W. Jamal, and S. Batcup, "Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model", Microelectronics Reliability, vol. 42, no. 7, pp. 1045-1052, 2002.
    • (2002) Microelectronics Reliability , vol.42 , Issue.7 , pp. 1045-1052
    • Igic, P.M.1    Mawby, P.A.2    Towers, M.S.3    Jamal, W.4    Batcup, S.5
  • 9
    • 33749650164 scopus 로고    scopus 로고
    • Modelação de semicondutores bipolares - Formulaç ão de um novo método para simulação em circuitos electrónicos de potência
    • Porto, Portugal
    • A. Araújo, "Modelação de semicondutores bipolares - formulação de um novo método para simulação em circuitos electrónicos de potência," in Faculdade de Engenharia da Universidade do Porto. Porto, Portugal, 1998.
    • (1998) Faculdade de Engenharia da Universidade do Porto
    • Araújo, A.1
  • 12
    • 0031335572 scopus 로고    scopus 로고
    • Parameter extraction methodology and validation for an electro-thermal physics-based NPT IGBT model
    • New Orleans, LA, USA
    • J. Sigg, P. Turkes, and R. Kraus, "Parameter extraction methodology and validation for an electro-thermal physics-based NPT IGBT model", Conference Record of the 32nd IAS Annual Meeting, pp. 1166-73 vol.2, New Orleans, LA, USA, 1997.
    • (1997) Conference Record of the 32nd IAS Annual Meeting , vol.2 , pp. 1166-1173
    • Sigg, J.1    Turkes, P.2    Kraus, R.3
  • 16
    • 0032071510 scopus 로고    scopus 로고
    • Status and trends of power semiconductor device models for circuit simulation
    • R. Kraus and H. Mattausch, "Status and Trends of Power Semiconductor Device Models for Circuit Simulation", IEEE Trans. Power Electron., vol. 13, no. 3, pp. 452-465, 1998.
    • (1998) IEEE Trans. Power Electron. , vol.13 , Issue.3 , pp. 452-465
    • Kraus, R.1    Mattausch, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.