Parasitic series resistance-independent method for device-model parameter extraction

IEE Proceedings: Circuits, Devices and Systems

Volumn 143, Issue 1, 1996, Pages 68-70

  Garcia Sanchez F J ^a   Ortiz Conde, A ^a   Lion, J J ^b  

^a UNIVERSIDAD SIMÓN BOLÍVAR   (Venezuela)

^b UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

I V characteristics; Model parameter extraction; P n diodes; Parasitic resistance; Semiconductor diodes

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; INTEGRAL EQUATIONS; PARAMETER ESTIMATION; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS;

PARASITIC SERIES RESISTANCE;

SEMICONDUCTOR DEVICE MODELS;

EID: 0030086253     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:19960159     Document Type: Article

References (7)

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