SCOPUS 정보 검색 플랫폼

Volumn 518, Issue 21, 2010, Pages 5928-5931

Thickness dependence of strain and in-plane dielectric properties of highly (001) oriented (Ba,Sr)TiO3 thin films

(3) Lu, Shengbo a Xu, Zhenkui a Zhai, Jiwei b

a CITY UNIVERSITY OF HONG KONG (Hong Kong)

Author keywords

Barium Strontium Titanate; In plane dielectric properties; Pulse laser deposition; Strain; Thin films; X ray diffraction

Indexed keywords

DIELECTRIC CONSTANTS; ELASTIC STRAIN; IN PLANE DIELECTRIC PROPERTIES; IN-PLANE; MINIMUM VALUE; PULSE LASER DEPOSITION; RESIDUAL STRAINS; THICKNESS DEPENDENCE; TIO; TUNABILITIES;

BARIUM; BARIUM STRONTIUM TITANATE; DEPOSITION; DIELECTRIC PROPERTIES; PULSED LASER DEPOSITION; PULSED LASERS; STRONTIUM; STRONTIUM TITANATES; THICK FILMS; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION;

BARIUM TITANATE;

EID: 77955557541 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2010.05.091 Document Type: Article

Times cited : (9)

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