Misfit dislocations in nanoscale ferroelectric heterostructures

Applied Physics Letters

Volumn 86, Issue 19, 2005, Pages 1-3

  Nagarajan, V ^a   Jia, C L ^a   Kohlstedt, H ^a   Waser, R ^a   Misirlioglu, I B ^b   Alpay, S P ^b   Ramesh, R ^c  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b UNIVERSITY OF CONNECTICUT   (United States)

^c Lawrence Berkeley National Laboratory   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOLARIZING FIELDS; DISLOCATION DENSITY; POLARIZATION GRADIENTS; STRAIN FIELD;

DEGRADATION; DISLOCATIONS (CRYSTALS); ELECTROMAGNETIC WAVE POLARIZATION; FERROELECTRIC MATERIALS; FILM GROWTH; NANOSTRUCTURED MATERIALS; PIEZOELECTRICITY; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

HETEROJUNCTIONS;

EID: 20844432367     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1922579     Document Type: Article

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