Can interface dislocations degrade ferroelectric properties?

Applied Physics Letters

Volumn 85, Issue 11, 2004, Pages 2044-2046

  Alpay, S P ^a   Misirlioglu, I B ^a   Nagarajan, V ^b   Ramesh, R ^c  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

^c Lawrence Berkeley National Laboratory   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC STIFFNESS; NANOMETERS; STRESS FIELDS; THREADING DISLOCATION DENSITY;

BARIUM COMPOUNDS; BOUNDARY CONDITIONS; COOLING; DIELECTRIC PROPERTIES; INTEGRATION; NANOSTRUCTURED MATERIALS; PEROVSKITE; POLARIZATION; STIFFNESS; THERMAL EFFECTS; THERMODYNAMICS; ULTRATHIN FILMS; VECTORS;

FERROELECTRIC MATERIALS;

EID: 5444249053     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1788894     Document Type: Article

References (17)

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