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Journal of the European Ceramic Society

Volumn 26, Issue 10-11, 2006, Pages 1873-1877

Thickness effects on microwave properties of (Ba,Sr)TiO3 films for frequency agile technologies

(4) Kageyama, K a Sakurai, A a Ando, A a Sakabe, Y a

a MURATA MANUFACTURING CO LTD (Japan)

Author keywords

Dielectric properties; Perovskite; Precursors organic

Indexed keywords

CAPACITANCE MEASUREMENT; CAPACITORS; DIELECTRIC PROPERTIES; ELECTROMAGNETIC FIELD EFFECTS; FINITE ELEMENT METHOD; GRAIN GROWTH; MICROWAVES; PERMITTIVITY; PEROVSKITE; SAPPHIRE; THIN FILMS;

METAL ORGANIC DECOMPOSITION METHOD; MICROWAVE PROPERTIES; PRECURSORS ORGANIC; THICKNESS EFFECTS;

BARIUM COMPOUNDS;

BARIUM COMPOUNDS; CAPACITANCE MEASUREMENT; CAPACITORS; DIELECTRIC PROPERTIES; ELECTROMAGNETIC FIELD EFFECTS; FINITE ELEMENT METHOD; GRAIN GROWTH; MICROWAVES; PERMITTIVITY; PEROVSKITE; SAPPHIRE; THIN FILMS;

EID: 33645546804 PISSN: 09552219 EISSN: None Source Type: Journal
DOI: 10.1016/j.jeurceramsoc.2005.09.090 Document Type: Conference Paper

Times cited : (22)

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