Dissociation and evolution of threading dislocations in epitaxial Ba0.3Sr0.7TiO3 thin films grown on (001) LaAlO3

Journal of Applied Physics

Volumn 93, Issue 1, 2003, Pages 512-521

  Lu, C J ^a   Bendersky, L A ^a   Chang, K ^b   Takeuchi, I ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COALESCENCE; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; NUCLEATION; PEROVSKITE; PULSED LASER DEPOSITION; STACKING FAULTS; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY; VECTORS;

THREADING DISLOCATIONS (TD);

THIN FILMS;

EID: 0037246480     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1524315     Document Type: Article

References (43)

1. V. K. Varadan, D. K. Ghodgaonkar, V. V. Varadan, J. F. Kelly, and P. Glikerdas, Microwave J. 35, 116 (1992).
2. J. Im, O. Auciello, P. K. Baumann, S. K. Streiffer, D. Y. Kaufman, and A. R. Krauss, Appl. Phys. Lett. 76, 625 (2000).
3. L. Ryen, X. Wang, P. Petrov, E. Carlsson, U. Helmersson, and E. Olsson, J. Appl. Phys. 85, 3976 (1999).
4. C. L. Canedy, H. Li, S. P. Alpay, L. Salamanca-Riba, A. L. Roytburd, and R. Ramesh, Appl. Phys. Lett. 77, 1695 (2000).
5. S. Hyun, J. H. Lee, S. S. Kim, K. Char, S. J. Park, J. Sok, and E. H. Lee, Appl. Phys. Lett. 77, 3084 (2000).
6. A. T. Findikoglu, Q. X. Jia, D. W. Reagor, and X. D. Wu, Microwave Opt. Technol. Lett. 9, 306 (1995).
7. I. Takeuchi, H. Chang, C. Gao, P. G. Schultz, X. D. Xiang, R. P. Sharma, M. J. Downes, and T. Venkatesan, Appl. Phys. Lett. 73, 894 (1998).
8. J. W. Matthews, Epitaxial Growth, edited by J. W. Matthews (Academic, New York, 1975), Part B, Chap. 8.
9. A. E. Romanov, W. Pompe, S. Mathis, G. E. Beltz, and J. S. Speck, J. Appl. Phys. 85, 182 (1999).
10. V. Narayanan, K. Lorenz, W. Kim, and S. Mahajan, Appl. Phys. Lett. 78, 1544 (2001).
11. L. H. Kuo, L. Salamanca-Riba, B. J. Wu, G. M. Haugen, J. M. DePuydt, G. Hofler, and H. Cheng, J. Vac. Sci. Technol. B 13, 1694 (1995).
12. W. Qian, M. Skowronski, R. Kaspi, M. De Graef, and V. P. Dravid, J. Appl. Phys. 81, 7268 (1997).
13. S. Stemmer, S. K. Streiffer, F. Ernst, and M. Ruehle, Phys. Status Solidi A 147, 135 (1995).
14. T. Suzuki, Y. Nishi, and M. Fujimoto, Philos. Mag. A 79, 2461 (1999).
15. J. S. Wu, C. L. Jia, K. Urban, J. H. Hao, and X. X. Xi, Philos. Mag. A 82, 65 (2002).
16. J. S. Wu, C. L. Jia, K. Urban, J. H. Hao, and X. X. Xi, Philos. Mag. Lett. 81, 375 (2001).
17. C. J. Lu, Z. L. Wang, C. Kwon, and Q. X. Jia, J. Appl. Phys. 88, 4032 (2000).
18. C. J. Lu, Z. L. Wang, G. C. Xiong, and G. J. Lian, J. Mater. Res. 15, 2454 (2000).
19. T. Matsunaga and H. Saka, Philos. Mag. Lett. 80, 597 (2000).
20. Z. Mao and K. M. Knowles, Philos. Mag. A 73, 699 (1996).
21. P. Besson, J. P. Poirier, and G. D. Price, Phys. Chem. Miner. 23, 337 (1996).
22. Y. Wang, J. P. Poirier, and R. C. Liebermann, Phys. Chem. Miner. 16, 630 (1989).
23. O. Eibl, P. Pongratz, P. Skalicky, and H. Schmelz, Phys. Status Solidi A 108, 495 (1988).
24. K. S. Chang, M. Aronova, O. Famodu, I. Takeuchi, S. E. Lofland, J. Hattrick-Simpers, and H. Chang, Appl. Phys. Lett. 79, 4411 (2001).
25. C. J. Lu, L. A. Bendersky, K. Chang, and I. Takeuchi (unpublished).
26. Certain commercial equipment, instruments, or materials are identified in this paper in order to specify the experimental procedure adequately. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the materials or equipment identified are necessarily the best available for the purpose.
27. C. J. Lu, L. A. Bendersky, K. Chang, and I. Takeuchi (unpublished).
28. P. B. Hirsch, A. Howie, R. Nicholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals, 2nd ed. (Krieger, Huntington, NY, 1977), Chap. 11.
29. W. J. Tunstall, P. B. Hirsch, and J. Steeds, Philos. Mag. 9, 99 (1964).
30. T. Suzuki, Y. Nishi, and M. Fujimoto, Jpn. J. Appl. Phys., Part 1 39, 5970 (2000).
31. T. Suzuki, Y. Nishi, and M. Fujimoto, Philos. Mag. A 80, 621 (2000).
32. S. Christiansen, M. Albrecht, H. P. Strunk, P. O. Hansson, and E. Bauser, Appl. Phys. Lett. 66, 574 (1995).
33. C. J. Lu, S. Senz, and D. Hesse, Philos. Mag. Lett. 82, 167 (2002).
34. J. L. Batstone, J. W. Steeds, and P. J. Wright, Philos. Mag. A 66, 609 (1992).
35. P. L. Gai, Acta Crystallogr., Sect. B: Struct. Sci. 53, 346 (1997).
36. P. L. Gai, K. Kourtakis, D. R. Coulson, and G. C. Sonnichsen, J. Phys. Chem. B 101, 9916 (1997).
37. T. Suzuki, Y. Nishi, and M. Fujimoto, Jpn. J. Appl. Phys., Part 1 39, 5970 (2000).
38. E. M. Levin, C. R. Robbins, and H. F. McMurdie, Phase Diagrams for Ceramics (The American Ceramic Society, Columbus, OH, 1974), p. 195.
39. D. L. Kaiser, M. D. Vaudin, L. D. Rotter, J. E. Bonevich, I. Levin, J. T. Armstrong, A. L. Roytburd, and D. G. Schlom, J. Mater. Res. 14, 4657 (1999).
40. P. Sheldon, K. M. Jones, M. M. Al-Jassim, and B. G. Yacobi, J. Appl. Phys. 63, 5609 (1988).
41. M. Tachikawa and M. Yamaguchi, Appl. Phys. Lett. 56, 484 (1990).
42. R. Beanland, D. J. Dunstan, and P. J. Goodhew, Adv. Phys. 45, 87 (1996).
43. J. C. Booth, K. Chang, and I. Takeuchi (unpublished).