Imaging using inelastically scattered electrons in CTEM and STEM geometry

Ultramicroscopy

Volumn 108, Issue 1, 2007, Pages 58-67

  Findlay, S D ^a   Schattschneider, P ^b   Allen, L J ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Electron energy loss spectroscopy; Reciprocity; Transmission electron microscopy

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

COUPLED CHANNELS; DENSITY MATRIX APPROACHES; RECIPROCITY; SPECIMEN THICKNESSES;

IMAGING TECHNIQUES;

ARTICLE; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE DISPLAY; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 35349005305     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.03.003     Document Type: Article

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