Spatial resolution of nanostructural analysis by electron energy-loss spectroscopy and energy-filtered imaging

Journal of Electron Microscopy

Volumn 48, Issue 6, 1999, Pages 711-716

  Egerton, Raymond F ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Atomic resolution; EELS; EFTEM; Elemental analysis

Indexed keywords

ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; IMAGE RESOLUTION;

ATOMIC-RESOLUTION; CORE LOSS SPECTROSCOPY; EFTEM; ELECTRON ENERGY-LOSS SPECTROSCOPIES; ENERGY-FILTERED IMAGING; FIELD EMISSION SOURCES; LOW CORE LOSS; NANOSTRUCTURAL ANALYSIS; RADIATION RESISTANT; SPATIAL RESOLUTION;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 0033492079     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023739     Document Type: Conference Paper

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