Relativistic calculations of intensity distributions in elemental maps using contrast transfer functions

Journal of Microscopy

Volumn 194, Issue 1, 1999, Pages 30-41

  Knippelmeyer, Rainer ^a   Kohl, H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Analytical electron microscopy; Contrast transfer function; Elemental mapping; Energy filtering electron microscopy; High voltage electron microscopy; Medium voltage electron microscopy; Relativistic inelastic scattering

Indexed keywords

ELECTRON MICROSCOPES; ELECTRONS; ENERGY DISSIPATION; INELASTIC SCATTERING; QUANTUM THEORY; TRANSFER FUNCTIONS;

ANALYTICAL ELECTRON MICROSCOPY; CONTRAST TRANSFER FUNCTION; ELEMENTAL MAPPING; ENERGY FILTERING; ENERGY FILTERING ELECTRON MICROSCOPY; HIGH VOLTAGE ELECTRON MICROSCOPY; MEDIUM VOLTAGE; MEDIUM VOLTAGE ELECTRON MICROSCOPY; RELATIVISTIC INELASTIC SCATTERING; RELATIVISTICS; VOLTAGE ELECTRONS;

ELECTRON MICROSCOPY;

ARTICLE; CALCULATION; ELECTRON MICROSCOPY; IMAGE ANALYSIS; MATHEMATICAL ANALYSIS; PRIORITY JOURNAL; QUANTUM MECHANICS; THEORY;

EID: 0033042873     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00470.x     Document Type: Article

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