SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 107, Issue 4-5, 2007, Pages 313-321

EFTEM assistant: A tool to understand the limitations of EFTEM

(2) Lozano Perez, S a Titchmarsh, J M a

a UNIVERSITY OF OXFORD (United Kingdom)

Author keywords

Delocalization; Digital micrograph; Drift; EFTEM; Image simulation; Script; Software

Indexed keywords

ABERRATIONS; COMPUTER SIMULATION; COMPUTER SOFTWARE; CONFORMAL MAPPING; DEGRADATION; ELECTRON OPTICS; MICROSTRUCTURE;

DELOCALIZATION; DIGITAL MICROGRAPH; DRIFT; IMAGE SIMULATION;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; COMPUTER PROGRAM; DEGRADATION; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; GATAN DIGITAL MICROGRAPH; GEOMETRY; IMAGE PROCESSING; IMAGE QUALITY; NOISE; OPTICAL INSTRUMENTATION; OPTICAL RESOLUTION; SIMULATION;

EID: 33846347544 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2006.08.006 Document Type: Article

Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.