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Volumn 6, Issue 2, 2000, Pages 161-172

Quantitative energy-filtering transmission electron microscopy in materials science

Author keywords

Analytical electron microscopy; Electron energy loss near edge fine structure; Energy filtering transmission electron microscopy; Phase imaging; Quantitative elemental maps; Scatter diagram

Indexed keywords


EID: 0003325123     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (19)

References (65)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.