Achieving sub-nanometre particle mapping with energy-filtered TEM

Ultramicroscopy

Volumn 109, Issue 10, 2009, Pages 1217-1228

  Lozano Perez, S ^a   de Castro Bernal, V ^a   Nicholls, R J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

EFTEM; MSA; ODS; Yttria

Indexed keywords

CHEMICAL MAPPING; CORE SHELL STRUCTURE; DATA SETS; EFTEM; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; FECR ALLOYS; MATRIX; MSA; MULTIVARIATE STATISTICAL ANALYSIS; NANOMETER-SIZED PARTICLES; NANOMETRES; ODS; OXIDE DISPERSION STRENGTHENED; STRUCTURAL MATERIALS; TEM; YTTRIA;

BUILDING MATERIALS; CHROMIUM; CORROSION RESISTANCE; DATA PROCESSING; DISSOLUTION; FUSION REACTORS; MULTIVARIANT ANALYSIS; NANOPARTICLES; OXYGEN; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM;

YTTRIUM ALLOYS;

CHROMIUM; FERRICHROME; NANOPARTICLE; OXIDE; OXYGEN; YTTRIUM;

ARTICLE; CONTROLLED STUDY; CORROSION; DISPERSION; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; MULTIVARIATE ANALYSIS; PARTICLE SIZE; SIGNAL NOISE RATIO;

EID: 68549120747     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.05.006     Document Type: Article

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