메뉴 건너뛰기




Volumn 107, Issue 2-3, 2007, Pages 232-244

Quantification and thickness correction of EFTEM phosphorus maps

Author keywords

Electron energy loss spectroscopy (EELS); Elemental mapping; Energy filtered transmission electron microscopy (EFTEM); Phosphorus; Plural scattering

Indexed keywords

IMAGE PROCESSING; PHOSPHORUS; SCATTERING; STATISTICAL METHODS;

EID: 33845607658     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.07.009     Document Type: Article
Times cited : (23)

References (39)
  • 33
    • 33845626308 scopus 로고    scopus 로고
    • R.F. Egerton, in: G.W. Bailey (Ed.), Proceedings of 39th Annual Meeting of Electron Microscopical Society of America, Claitor's Publishing, Baton Rouge, LA, 1981, p. 198.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.