Micro-contact printing of poly(3-hexylthiophene) on silicon oxide: Effect of stamp stretching

European Polymer Journal

Volumn 46, Issue 8, 2010, Pages 1660-1670

  Scavia, Guido ^a   Porzio, William ^a   Destri, Silvia ^a   Barba, Luisa ^b   Arrighetti, Gianmichele ^b  

^a CNR   (Italy)

^b CNR   (Italy)

Author keywords

Atomic force microscopy; Micro contact printing; Poly(3 hexylthiophene) film; Structure and morphology

Indexed keywords

AFM; FILM STRUCTURE; MECHANICAL PRESSURE; MICRO CONTACT PRINTING; POLY (3-HEXYLTHIOPHENE); POLYDIMETHYLSILOXANE STAMPS; SILICON OXIDE SUBSTRATES; STRETCHING DIRECTION; STRUCTURE AND MORPHOLOGY; XRD;

ATOMIC FORCE MICROSCOPY; CARRIER MOBILITY; MORPHOLOGY; PRINTING; SILICON OXIDES; SILICONES;

CRYSTAL ATOMIC STRUCTURE;

EID: 77955468983     PISSN: 00143057     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eurpolymj.2010.05.010     Document Type: Article

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