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Review of Scientific Instruments

Volumn 81, Issue 6, 2010, Pages

Imaging dislocations in gallium nitride across broad areas using atomic force microscopy

(5) Bennett, S E a Holec, D a,b Kappers, M J a Humphreys, C J a Oliver, R A a

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

b UNIVERSITY OF LEOBEN (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; DENSITY IMAGES; EPITAXIAL LAYER OVERGROWTHS; KELVIN PROBE FORCE MICROSCOPY; SAMPLING RATES; SOFTWARE TOOL; SPATIAL DISTRIBUTION; SURFACE PITS; THREADING DISLOCATION;

ATOMIC FORCE MICROSCOPY; GALLIUM ALLOYS; PIXELS; SIZE DISTRIBUTION;

GALLIUM NITRIDE;

EID: 77954209310 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3430539 Document Type: Article

Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.