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Volumn 43, Issue 5, 2010, Pages
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Measuring dislocation densities in nonpolar a-plane GaN films using atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
A-PLANE GAN;
AFM;
CALIBRATION SAMPLES;
DISLOCATION DENSITIES;
IN-BAND;
NON-POLAR;
NON-POLAR GAN;
NUMBER OF PITS;
SPATIAL ANALYSIS;
TRANSMISSION ELECTRON;
ATOMIC FORCE MICROSCOPY;
COALESCENCE;
GALLIUM ALLOYS;
GALLIUM NITRIDE;
TRANSMISSION ELECTRON MICROSCOPY;
SURFACE TREATMENT;
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EID: 76649122818
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/43/5/055303 Document Type: Article |
Times cited : (20)
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References (34)
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