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Volumn 43, Issue 5, 2010, Pages

Measuring dislocation densities in nonpolar a-plane GaN films using atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

A-PLANE GAN; AFM; CALIBRATION SAMPLES; DISLOCATION DENSITIES; IN-BAND; NON-POLAR; NON-POLAR GAN; NUMBER OF PITS; SPATIAL ANALYSIS; TRANSMISSION ELECTRON;

EID: 76649122818     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/43/5/055303     Document Type: Article
Times cited : (20)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.