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Volumn 85, Issue 16, 2004, Pages 3411-3413

Revealing all types of threading dislocations in GaN with improved contrast in a single plan view image

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; ION BEAMS; METALLORGANIC VAPOR PHASE EPITAXY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 9744248667     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1807962     Document Type: Article
Times cited : (36)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.