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Volumn 85, Issue 16, 2004, Pages 3411-3413
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Revealing all types of threading dislocations in GaN with improved contrast in a single plan view image
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL STRUCTURE;
DISLOCATIONS (CRYSTALS);
EPITAXIAL GROWTH;
ION BEAMS;
METALLORGANIC VAPOR PHASE EPITAXY;
TRANSMISSION ELECTRON MICROSCOPY;
DISLOCATION DENSITY;
EPITAXIAL LATERAL OVERGROWTH (ELO);
PSEUDO-ELASTIC ISOTROPY;
THREADING DISLOCATIONS (TD);
GALLIUM NITRIDE;
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EID: 9744248667
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1807962 Document Type: Article |
Times cited : (36)
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References (7)
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