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Applied Physics Letters

Volumn 74, Issue 23, 1999, Pages 3537-3539

Rapid evaluation of dislocation densities in n-type GaN films using photoenhanced wet etching

(4) Youtsey, C a Romano, L T b Molnar, R J c Adesida, I a

a University of Illinois at Urbana Champaign (United States)

b PALO ALTO RESEARCH CENTER (United States)

c MIT LINCOLN LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000198240 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.124153 Document Type: Article

Times cited : (149)

References (13)

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