Soft error assessments for servers

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2010, Pages 391-394

  Muller, K Paul ^a   Sanda, Pia N ^a  

^a IBM   (United States)

Author keywords

Cross layer optimization; Derating; SER protection; Server; Soft error rates; System assessments

Indexed keywords

CROSS LAYER OPTIMIZATION; DERATING; SER PROTECTION; SOFT ERROR RATE; SYSTEM ASSESSMENT;

ERROR CORRECTION; MICROPROCESSOR CHIPS; OPTIMIZATION; SERVERS;

ERROR DETECTION;

EID: 77957913318     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2010.5488799     Document Type: Conference Paper

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