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Volumn 25, Issue 6, 2010, Pages 760-784

Advances in atomic spectrometry and related techniques

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC EMISSION; ATOMIC SPECTROMETRY; CHEMOMETRICS; CRITICAL APPROACH; DIRECT SOLIDS ANALYSIS; FEMTOSECOND UV LASERS; GEOLOGICAL APPLICATIONS; GROWTH AREAS; IR MEASUREMENTS; SAMPLE INTRODUCTION; SF-ICP-MS;

EID: 77952692433     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/c005211f     Document Type: Review
Times cited : (25)

References (326)
  • 42
    • 67649363306 scopus 로고    scopus 로고
    • J. K. Duan B. Hu Talanta 2009 79 3 734 738
    • (2009) Talanta , vol.79 , Issue.3 , pp. 734-738
    • Duan, J.K.1    Hu, B.2
  • 193
  • 216


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.