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Volumn 27, Issue 6, 2008, Pages 609-623

Femtosecond laser ablation inductively coupled plasma mass spectrometry: Fundamentals and capabilities for depth profiling analysis

Author keywords

Depth profiling; Femtosecond laser; Inductively coupled plasma mass spectrometry; Laser ablation

Indexed keywords

AEROSOLS; ATMOSPHERIC AEROSOLS; CHEMICAL ANALYSIS; CHEMICAL ELEMENTS; DEPTH PROFILING; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; IONIZATION; LASER ABLATION; LASER APPLICATIONS; LASER EXCITATION; LASERS; MASS SPECTROMETERS; MASS SPECTROMETRY; PHOTORESISTS; PLASMAS; POLYMERS; PULSED LASER APPLICATIONS; PULSED LASER DEPOSITION; SEMICONDUCTOR LASERS; SPECTROMETERS; SPECTROMETRY; SPECTRUM ANALYSIS; TRACE ELEMENTS; ULTRASHORT PULSES;

EID: 57249101999     PISSN: 02777037     EISSN: None     Source Type: Journal    
DOI: 10.1002/mas.20180     Document Type: Article
Times cited : (92)

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