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Journal of Analytical Atomic Spectrometry

Volumn 24, Issue 11, 2009, Pages 1534-1544

Precise determination of Sm, Nd concentrations and Nd isotopic compositions at the nanogram level in geological samples by thermal ionization mass spectrometry

(4) Chu, Zhuyin a Chen, Fukun a Yang, Yueheng a Guo, Jinhui a

a INSTITUTE OF GEOLOGY AND GEOPHYSICS (China)

Author keywords

[No Author keywords available]

Indexed keywords

ENVIRONMENTAL SAMPLE; GEOLOGICAL SAMPLES; HIGH SENSITIVITY; ION BEAM STABILITY; ION EMITTER; ION YIELDS; ISOTOPIC COMPOSITION; ISOTOPIC DATA; LOADING TECHNIQUE; MEASUREMENT METHODS; NANOGRAMS; ND ISOTOPES; OXYGEN GAS; REFERENCE MATERIAL; SAMPLE SIZES; THERMAL IONIZATION MASS SPECTROMETRY; ULTRAMAFIC ROCKS; W FILAMENT;

CERIUM; CERIUM COMPOUNDS; FILAMENTS (LAMP); GARNETS; ION BEAMS; ION SOURCES; IONIZATION OF GASES; IONS; ISOTOPES; MASS SPECTROMETERS; MASS SPECTROMETRY; MINERALS; NEODYMIUM ALLOYS; OXYGEN; SILICA; SILICATE MINERALS; SPONTANEOUS EMISSION;

NEODYMIUM;

EID: 70350222073 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/b904047a Document Type: Article

Times cited : (150)

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