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Volumn 25, Issue 5, 2010, Pages 1251-1264

Comprehensive compact models for the circuit simulation of multichip power modules

Author keywords

Diodes; Electromagnetic effects; Electrothermal effects; Insulated gate bipolar transistor (IGBT); Modeling; Power semiconductor devices; Simulation

Indexed keywords

APPLICATION SCENARIO; BEHAVIORAL DESCRIPTIONS; COMPACT MODEL; COMPUTATIONAL EFFORT; DEVICE MODELS; ELECTRO-THERMAL EFFECTS; ELECTROMAGNETIC EFFECTS; ELECTROMAGNETIC PHENOMENA; EQUIVALENT MODEL; FINITE DIFFERENCE; INSULATED GATE BIPOLAR TRANSISTOR MODULES; LUMPED ELEMENT; MODEL DEVELOPMENT; MODELING; MODELING POWER; MULTI-CHIP; MULTICHIP POWER MODULE; NUMERICAL SIMULATION; PARALLEL DEVICES; PARASITIC ELEMENT; POWER MODULE; RAILWAY TRACTION; SELF-HEATING EFFECT; SEMICONDUCTOR PHYSICS; SIMULATION EXAMPLE; STRUCTURAL ASSEMBLIES; THERMAL PHENOMENA;

EID: 77952148799     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2009.2036728     Document Type: Article
Times cited : (30)

References (37)
  • 4
    • 0141643281 scopus 로고    scopus 로고
    • Characterization and modeling of high-voltage field-stop IGBTs
    • Jul./Aug.
    • X. Kang, A. Caiafa, E. Santi, J. L. Hudgins, and P. R. Palmer, "Characterization and modeling of high-voltage field-stop IGBTs," IEEE Trans. Ind. Appl., vol.39, no.4, pp. 922-928, Jul./Aug. 2003.
    • (2003) IEEE Trans. Ind. Appl. , vol.39 , Issue.4 , pp. 922-928
    • Kang, X.1    Caiafa, A.2    Santi, E.3    Hudgins, J.L.4    Palmer, P.R.5
  • 5
    • 33748041125 scopus 로고    scopus 로고
    • Compact modelling and analysis of power-sharing unbalances in IGBT modules used in traction applications
    • A. Castellazzi, G. Lourdel, M. Ciappa, M. Mermet-Guyennet, and W. Fichtner, "Compact modelling and analysis of power-sharing unbalances in IGBT modules used in traction applications," Microelectron. Rel., vol.46, pp. 1754-1759, 2006.
    • (2006) Microelectron. Rel. , vol.46 , pp. 1754-1759
    • Castellazzi, A.1    Lourdel, G.2    Ciappa, M.3    Mermet-Guyennet, M.4    Fichtner, W.5
  • 6
    • 39749162141 scopus 로고    scopus 로고
    • Integrated compact modelling of a planar-gate nonpunchthrough 3.3 kV-1200 A IGBT module for insightful analysis and realistic interpretation of the failure mechanisms
    • Jeju, South Korea, May
    • A. Castellazzi, M. Ciappa, J. Urresti-Ibañez, M. Mermet-Guyennet, and W. Fichtner, "Integrated compact modelling of a planar-gate nonpunchthrough 3.3 kV-1200 A IGBT module for insightful analysis and realistic interpretation of the failure mechanisms," in Proc. IEEE Int. Symp. Power Semicond. Devices ICs (ISPSD 2007), Jeju, South Korea, May, pp. 133- 136.
    • Proc. IEEE Int. Symp. Power Semicond. Devices ICs (ISPSD 2007) , pp. 133-136
    • Castellazzi, A.1    Ciappa, M.2    Urresti-Ibañez, J.3    Mermet-Guyennet, M.4    Fichtner, W.5
  • 12
    • 0031633633 scopus 로고    scopus 로고
    • Physics-based models of power semiconductor devices for the circuit simulator SPICE
    • Fukuoka, Japan
    • R. Kraus, P. Türkes, and J. Sigg, "Physics-based models of power semiconductor devices for the circuit simulator SPICE," in Proc. IEEE Power Electron. Spec. Conf. (PESC 1998), Fukuoka, Japan, vol.2, pp. 1726- 1731.
    • Proc. IEEE Power Electron. Spec. Conf. (PESC 1998) , vol.2 , pp. 1726-1731
    • Kraus, R.1    Türkes, P.2    Sigg, J.3
  • 13
    • 0032071510 scopus 로고    scopus 로고
    • Status and trends of power semiconductor devices models for circuit simulation
    • May
    • R. Kraus and H. J. Mattausch, "Status and trends of power semiconductor devices models for circuit simulation," IEEE Trans. Power Electron., vol.13, no.3, pp. 452-465, May 1998.
    • (1998) IEEE Trans. Power Electron. , vol.13 , Issue.3 , pp. 452-465
    • Kraus, R.1    Mattausch, H.J.2
  • 14
    • 0017482694 scopus 로고
    • The pn-Product in silicon
    • J.W. Slotboom, "The pn-Product in silicon," Solid State Electron., vol.20, pp. 279-283, 1977.
    • (1977) Solid State Electron. , vol.20 , pp. 279-283
    • Slotboom, J.W.1
  • 18
    • 0029748173 scopus 로고    scopus 로고
    • Implementation and validation of a new diode model for circuit simulation
    • Baveno, Italy, Jun. 23-27
    • P. Leturq, M. O. Berraies, and J. L. Massol, "Implementation and validation of a new diode model for circuit simulation," in Proc. IEEE Power Electron. Spec. Conf. (PESC 1996), Baveno, Italy, Jun. 23-27, vol.1, pp. 35-43.
    • Proc. IEEE Power Electron. Spec. Conf. (PESC 1996) , vol.1 , pp. 35-43
    • Leturq, P.1    Berraies, M.O.2    Massol, J.L.3
  • 21
    • 33646519186 scopus 로고    scopus 로고
    • Reliability analysis and modeling of PowerMOSFETs in the 42V-PowerNet
    • May
    • A. Castellazzi, Y. G. Gertsenmaier, R. Kraus, and G. Wachutka, "Reliability analysis and modeling of PowerMOSFETs in the 42V-PowerNet," IEEE Trans. Power Electron., vol.21, no.3, pp. 603-612, May 2006.
    • (2006) IEEE Trans. Power Electron. , vol.21 , Issue.3 , pp. 603-612
    • Castellazzi, A.1    Gertsenmaier, Y.G.2    Kraus, R.3    Wachutka, G.4
  • 23
    • 8744292890 scopus 로고    scopus 로고
    • Numerical analysis tool for transient skin effect problems
    • Aachen, Germany
    • P. Böhm and G. Wachutka, "Numerical analysis tool for transient skin effect problems," in Proc. IEEE Power Electron. Spec. Conf. (PESC 2004), Aachen, Germany, vol.2, pp. 880-884.
    • Proc. IEEE Power Electron. Spec. Conf. (PESC 2004) , vol.2 , pp. 880-884
    • Böhm, P.1    Wachutka, G.2
  • 25
    • 0025512595 scopus 로고
    • Rigorous thermodynamic treatment of heat generation and conductionin semiconductor device modeling
    • Nov.
    • G.Wachutka, "Rigorous thermodynamic treatment of heat generation and conductionin semiconductor device modeling," IEEE Trans. Comput. Comput.-Aided Des. Integr. Circuits Syst., vol.9, no.11, pp. 1141-1149, Nov. 1990.
    • (1990) IEEE Trans. Comput. Comput.-Aided Des. Integr. Circuits Syst. , vol.9 , Issue.11 , pp. 1141-1149
    • Wachutka, G.1
  • 27
    • 2442447000 scopus 로고    scopus 로고
    • Studies on the nonlinearity effects in dynamic compact model generation of packages
    • Mar.
    • M. Rencz and V. Sźekely, "Studies on the nonlinearity effects in dynamic compact model generation of packages," IEEE Trans. Compon. Packag. Technol., vol.27, no.1, pp. 124-130, Mar. 2004.
    • (2004) IEEE Trans. Compon. Packag. Technol. , vol.27 , Issue.1 , pp. 124-130
    • Rencz, M.1    Sźekely, V.2
  • 29
    • 0028497840 scopus 로고
    • Thermal component model for electrothermal network simulation
    • Sep.
    • A. Hefner and D. Blackburn, "Thermal component model for electrothermal network simulation," IEEE Trans.Compon.,Packag. Manuf. Technol., A, vol.17, no.3, pp. 413-424, Sep. 1994.
    • (1994) IEEE Trans.Compon.,Packag. Manuf. Technol., A , vol.17 , Issue.3 , pp. 413-424
    • Hefner, A.1    Blackburn, D.2
  • 30
    • 34548073818 scopus 로고    scopus 로고
    • A fixed-angle heat spreading model for dynamic thermal characterization of rear-cooled substrates
    • San Jose, CA, Mar. 20-22
    • B. Vermeersch and G. De Mey, "A fixed-angle heat spreading model for dynamic thermal characterization of rear-cooled substrates," in Proc. 23rd IEEE SEMI-THERM Symp., San Jose, CA, Mar. 20-22, 2007, pp. 95- 101.
    • (2007) Proc. 23rd IEEE SEMI-THERM Symp. , pp. 95-101
    • Vermeersch, B.1    De Mey, G.2
  • 31
    • 0033099614 scopus 로고    scopus 로고
    • Choosing a thermal model for electrothermal simulation of power semiconductor devices
    • Mar.
    • A. Ammous, S. Ghedira, B. Allard, H. Morel, and D. Renault, "Choosing a thermal model for electrothermal simulation of power semiconductor devices," IEEE Trans. Power Electron., vol.14, no.2, pp. 300-307, Mar. 1999.
    • (1999) IEEE Trans. Power Electron. , vol.14 , Issue.2 , pp. 300-307
    • Ammous, A.1    Ghedira, S.2    Allard, B.3    Morel, H.4    Renault, D.5
  • 32
    • 4344663044 scopus 로고    scopus 로고
    • Mixed-mode system design: VHDL-AMS
    • S. Garcia Sabiro, "Mixed-mode system design: VHDL-AMS," Microelectron. Eng., vol.54, pp. 171-180, 2000.
    • (2000) Microelectron. Eng. , vol.54 , pp. 171-180
    • Garcia Sabiro, S.1
  • 33
    • 24144462863 scopus 로고    scopus 로고
    • Extraction of accurate thermal compact models for fast electrothermal simulation of IGBT modules in Hybrid Electric Vehicles
    • M. Ciappa,W. Fichtner, T.Kojima,Y.Yamada, andY. Nishibe, "Extraction of accurate thermal compact models for fast electrothermal simulation of IGBT modules in Hybrid Electric Vehicles," Microelectron. Rel., vol.45, pp. 1694-1700, 2005.
    • (2005) Microelectron. Rel. , vol.45 , pp. 1694-1700
    • Ciappa, M.1    Fichtner, W.2    Kojima, T.3    Yamada, Y.4    Nishibe, Y.5
  • 34
    • 33947178937 scopus 로고    scopus 로고
    • Electro-thermal simulation of multichip modules with novel transient thermal model and time-dependent boundary conditions
    • Jan.
    • Y. G. Gerstenmaier, A. Castellazzi, and G. Wachutka, "Electro- thermal simulation of multichip modules with novel transient thermal model and time-dependent boundary conditions," IEEE Trans. Power Electron., vol.21, no.1, pp. 45-55, Jan. 2006.
    • (2006) IEEE Trans. Power Electron. , vol.21 , Issue.1 , pp. 45-55
    • Gerstenmaier, Y.G.1    Castellazzi, A.2    Wachutka, G.3
  • 36
    • 0036540853 scopus 로고    scopus 로고
    • Selected failure mechanisms of modern power modules
    • M. Ciappa, "Selected failure mechanisms of modern power modules," Microelectron. Rel., vol.42, pp. 653-667, 2002.
    • (2002) Microelectron. Rel. , vol.42 , pp. 653-667
    • Ciappa, M.1
  • 37
    • 56649102482 scopus 로고    scopus 로고
    • Multilevel electro-thermal modeling for circuit simulation of packaged power devices
    • Zurich, Switzerland, Aug.
    • A. Castellazzi and M. Ciappa, "Multilevel electro-thermal modeling for circuit simulation of packaged power devices," in Proc. IEEE Workshop Control Model. Power Electron. (COMPEL 2008), Zurich, Switzerland, Aug. 2008, pp. 1-6.
    • (2008) Proc. IEEE Workshop Control Model. Power Electron. (COMPEL 2008) , pp. 1-6
    • Castellazzi, A.1    Ciappa, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.