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Volumn 21, Issue 1, 2006, Pages 45-55

Electrothermal simulation of multichip-modules with novel transient thermal model and time-dependent boundary conditions

Author keywords

DC and ac converter for automotive; Electrothermal simulation; Multichip modules; PSpice metal oxide semiconductor field effect transistor (MOSFET) model; Thermal equivalent circuit; Time dependent boundary conditions

Indexed keywords

DC- AND AC-CONVERTER FOR AUTOMOTIVES; ELECTROTHERMAL SIMULATION; MULTICHIP-MODULES; THERMAL EQUIVALENT CIRCUITS; TIME-DEPENDENT BOUNDARY CONDITIONS;

EID: 33947178937     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2005.861116     Document Type: Article
Times cited : (70)

References (29)
  • 1
    • 2442560091 scopus 로고    scopus 로고
    • Efficient calculation of transient temperature fields responding to fast changing heatsources over long duration in power electronic systems
    • Mar
    • Y. C. Gerstenmaier and G. Wachutka, "Efficient calculation of transient temperature fields responding to fast changing heatsources over long duration in power electronic systems," IEEE Trans. Comp. Packag. Technol., vol. 27, no. 1, pp. 104-111, Mar. 2004.
    • (2004) IEEE Trans. Comp. Packag. Technol , vol.27 , Issue.1 , pp. 104-111
    • Gerstenmaier, Y.C.1    Wachutka, G.2
  • 2
    • 15744391402 scopus 로고    scopus 로고
    • Efficient calculation of transient temperature fields with general boundary conditions in electronic systems
    • Lodz, Poland, Jun
    • _, "Efficient calculation of transient temperature fields with general boundary conditions in electronic systems," in Proc. 10th MIXDES Conf., Lodz, Poland, Jun. 2003, pp. 313-318.
    • (2003) Proc. 10th MIXDES Conf , pp. 313-318
    • Gerstenmaier, Y.C.1    Wachutka, G.2
  • 3
    • 33947123499 scopus 로고    scopus 로고
    • Ansys, Inc, Tech. Rep, Online] Available
    • Ansys, Inc. (2005). Tech. Rep. [Online] Available: http//www.ansys.com
    • (2005)
  • 4
    • 84893798800 scopus 로고    scopus 로고
    • Fast field solvers for thermal and electrostatic analysis
    • Paris, France, Feb
    • V. Székely and M. Rencz, "Fast field solvers for thermal and electrostatic analysis," in Proc. Design, Automation Test Europe, Paris, France, Feb. 1998, pp. 518-523.
    • (1998) Proc. Design, Automation Test Europe , pp. 518-523
    • Székely, V.1    Rencz, M.2
  • 5
    • 0032043613 scopus 로고    scopus 로고
    • An efficient thermal simulation tool for ICs, microsystem elements and MCMs: The μs-THERMANAL
    • A. Csendes, V. Székely, and M. Rencz, "An efficient thermal simulation tool for ICs, microsystem elements and MCMs: the μs-THERMANAL, " Microelectron. J., vol. 29, pp. 241-255, 1998.
    • (1998) Microelectron. J , vol.29 , pp. 241-255
    • Csendes, A.1    Székely, V.2    Rencz, M.3
  • 6
    • 0035480159 scopus 로고    scopus 로고
    • Time dependent temperature fields calculated using Eigenfunctions and Eigenvalues of the heat conduction equation
    • Y. C. Gerstenmaier and G. Wachutka, "Time dependent temperature fields calculated using Eigenfunctions and Eigenvalues of the heat conduction equation," Microelectron. J., vol. 32, pp. 801-808, 2001.
    • (2001) Microelectron. J , vol.32 , pp. 801-808
    • Gerstenmaier, Y.C.1    Wachutka, G.2
  • 7
    • 0032676548 scopus 로고    scopus 로고
    • Creation and evaluation of compact models for thermal characterization using dedicated optimization software
    • San Diego, CA
    • C. J. M. Lasance, D. den Hertog, and P. Stehouwer, "Creation and evaluation of compact models for thermal characterization using dedicated optimization software," in Proc. IEEE SEMI-THERM XV, San Diego, CA, 1999, pp. 189-200.
    • (1999) Proc. IEEE SEMI-THERM XV , pp. 189-200
    • Lasance, C.J.M.1    den Hertog, D.2    Stehouwer, P.3
  • 8
    • 0031381701 scopus 로고    scopus 로고
    • The world of thermal characterization according to DELPHI-part I: Background to DELPHI" and "part II: experimental and numerical methods
    • Dec
    • H. Rosten, C. J. M. Lasance, and J. Parry, ""The world of thermal characterization according to DELPHI-part I: background to DELPHI" and "part II: experimental and numerical methods"," IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 20, no. 4, pp. 384-398, Dec. 1997.
    • (1997) IEEE Trans. Comp., Packag., Manufact. Technol. A , vol.20 , Issue.4 , pp. 384-398
    • Rosten, H.1    Lasance, C.J.M.2    Parry, J.3
  • 9
    • 0033359074 scopus 로고    scopus 로고
    • Static and dynamic thermal modeling of ICs
    • M. N. Sabry, "Static and dynamic thermal modeling of ICs," Microelcetron. J., vol. 30, pp. 1085-1091, 1999.
    • (1999) Microelcetron. J , vol.30 , pp. 1085-1091
    • Sabry, M.N.1
  • 10
    • 0032641940 scopus 로고    scopus 로고
    • Generation and verification of boundary independent compact thermal models for active components according to the DELPHI/SEED methods
    • San Diego, CA
    • H. Pape and G. Noebauer, "Generation and verification of boundary independent compact thermal models for active components according to the DELPHI/SEED methods," in Proc. IEEE SEMI-THERM XV, San Diego, CA, 1999, pp. 201-207.
    • (1999) Proc. IEEE SEMI-THERM XV , pp. 201-207
    • Pape, H.1    Noebauer, G.2
  • 11
    • 0036722931 scopus 로고    scopus 로고
    • Rigorous model and network for static thermal problems
    • Y. C. Gerstenmaier, H. Pape, and G. Wachutka, "Rigorous model and network for static thermal problems," Microelcctron. J., vol. 33, pp. 711-718, 2002.
    • (2002) Microelcctron. J , vol.33 , pp. 711-718
    • Gerstenmaier, Y.C.1    Pape, H.2    Wachutka, G.3
  • 13
    • 0035696842 scopus 로고    scopus 로고
    • Dynamic thermal multiport modeling of IC packages
    • Dec
    • M. Rencz and V. Székely, "Dynamic thermal multiport modeling of IC packages," IEEE Trans. Comp. Packag. Technol., vol. 24, no. 4, pp. 596-604, Dec. 2001.
    • (2001) IEEE Trans. Comp. Packag. Technol , vol.24 , Issue.4 , pp. 596-604
    • Rencz, M.1    Székely, V.2
  • 14
    • 0036723015 scopus 로고    scopus 로고
    • Rigorous model and network for transient thermal problems
    • Y. C. Gerstenmaier and G. Wachutka, "Rigorous model and network for transient thermal problems," Microelectron. J., vol. 33, pp. 719-725, 2002.
    • (2002) Microelectron. J , vol.33 , pp. 719-725
    • Gerstenmaier, Y.C.1    Wachutka, G.2
  • 15
    • 28144459537 scopus 로고    scopus 로고
    • Boundary condition independent dynamic thermal compact models of IC-packages
    • Aix-en-Provence, France, Sep
    • D. Schweitzer and H. Pape, "Boundary condition independent dynamic thermal compact models of IC-packages," in Proc. 9th THERMINIC, Aix-en-Provence, France, Sep. 2003, pp. 225-230.
    • (2003) Proc. 9th THERMINIC , pp. 225-230
    • Schweitzer, D.1    Pape, H.2
  • 16
    • 0035691287 scopus 로고    scopus 로고
    • Electrothermal CAD of power devices and circuits with fully physical time-dependent compact thermal modeling of complex nonlinear 3-D systems
    • Dec
    • W. Batty, C. Christofferson, A. J. Panks, S. David, C. M. Snowden, and M. B. Steer, "Electrothermal CAD of power devices and circuits with fully physical time-dependent compact thermal modeling of complex nonlinear 3-D systems," IEEE Trans. Comp. Packag. Technol., vol. 24, no. 4, pp. 566-590, Dec. 2001.
    • (2001) IEEE Trans. Comp. Packag. Technol , vol.24 , Issue.4 , pp. 566-590
    • Batty, W.1    Christofferson, C.2    Panks, A.J.3    David, S.4    Snowden, C.M.5    Steer, M.B.6
  • 17
    • 15744377392 scopus 로고    scopus 로고
    • Transient temperature fields with general nonlinear boundary conditions in electronic systems
    • Mar
    • Y. C. Gerstenmaier and G. Wachutka, "Transient temperature fields with general nonlinear boundary conditions in electronic systems," IEEE Trans. Comp. Packag. Technol., vol. 28, no. 1, pp. 23-33, Mar. 2005.
    • (2005) IEEE Trans. Comp. Packag. Technol , vol.28 , Issue.1 , pp. 23-33
    • Gerstenmaier, Y.C.1    Wachutka, G.2
  • 18
    • 2442447000 scopus 로고    scopus 로고
    • Studies on the nonlinearity effects in dynamic compact model generation of packages
    • Mar
    • M. Rencz and V. Székely, "Studies on the nonlinearity effects in dynamic compact model generation of packages," IEEE Trans. Comp. Packag. Technol., vol. 27, no. 1, pp. 124-130, Mar. 2004.
    • (2004) IEEE Trans. Comp. Packag. Technol , vol.27 , Issue.1 , pp. 124-130
    • Rencz, M.1    Székely, V.2
  • 20
    • 0033740623 scopus 로고    scopus 로고
    • Calculation of the temperature development in electronic systems by convolution integrals
    • San Jose, CA
    • Y. C. Gerstenmaier and G. Wachutka, "Calculation of the temperature development in electronic systems by convolution integrals," in Proc. IEEE SEMI-THERM XVI, San Jose, CA, 2000, pp. 50-59.
    • (2000) Proc. IEEE SEMI-THERM XVI , pp. 50-59
    • Gerstenmaier, Y.C.1    Wachutka, G.2
  • 21
    • 25544469442 scopus 로고    scopus 로고
    • On packaging techniques for a high power density dc/dc converter,
    • M.S. thesis. Rand Afrikaans Univ, Johannesburg, South Africa, Dec
    • M. B. Gerber, "On packaging techniques for a high power density dc/dc converter," M.S. thesis. Rand Afrikaans Univ., Johannesburg, South Africa, Dec. 2001.
    • (2001)
    • Gerber, M.B.1
  • 23
    • 6344249369 scopus 로고    scopus 로고
    • Compact thermal model for transient temperature fields in electronic systems
    • San Juan, Puerto Rico, Apr
    • Y. C. Gerstenmaier and G. Wachutka, "Compact thermal model for transient temperature fields in electronic systems," in Proc. 5th Conf. Modeling Simulation Microsystems (MSM'02), San Juan, Puerto Rico, Apr. 2002, pp. 608-611.
    • (2002) Proc. 5th Conf. Modeling Simulation Microsystems (MSM'02) , pp. 608-611
    • Gerstenmaier, Y.C.1    Wachutka, G.2
  • 24
    • 33947180778 scopus 로고    scopus 로고
    • Eupec, Inc, Online] Available
    • Eupec, Inc. (2005). Simulation tool IPOSIM. [Online] Available: http://www.eupec.com
    • (2005) Simulation tool IPOSIM
  • 25
    • 33947189821 scopus 로고    scopus 로고
    • Online] Available
    • Infinion. (2005). [Online] Available: http://www.infineon.com
    • (2005)
    • Infinion1
  • 27
    • 0036723016 scopus 로고    scopus 로고
    • Application of Green's functions for analysis of transient thermal states in electronic circuits
    • M. Janicki, G. DeMey, and A. Napieralski, "Application of Green's functions for analysis of transient thermal states in electronic circuits," Microelectron. J., vol. 33, pp. 733-738, 2002.
    • (2002) Microelectron. J , vol.33 , pp. 733-738
    • Janicki, M.1    DeMey, G.2    Napieralski, A.3
  • 28
    • 15744402676 scopus 로고    scopus 로고
    • Analytical transient solution of heat equation with variable heat transfer coefficient
    • Madrid, Spain, Oct
    • M. Janicki and A. Napieralski, "Analytical transient solution of heat equation with variable heat transfer coefficient," in Proc. 8th THERMINIC, Madrid, Spain, Oct. 2002, pp. 235-240.
    • (2002) Proc. 8th THERMINIC , pp. 235-240
    • Janicki, M.1    Napieralski, A.2
  • 29
    • 33947169757 scopus 로고    scopus 로고
    • A new procedure for the calculation of the temperature development in electronic systems
    • CD-ROM
    • Y. C. Gerstenmaier and G. Wachulka. A new procedure for the calculation of the temperature development in electronic systems, presented at EPE'99 Conf. [CD-ROM]
    • presented at EPE'99 Conf
    • Gerstenmaier, Y.C.1    Wachulka, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.