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Volumn , Issue , 2007, Pages 95-101

A fixed-angle heat spreading model for dynamic thermal characterization of rear-cooled substrates

Author keywords

Dynamic model; Fixed angle; Heat spreading; Rear cooling; Substrate; Thermal impedance

Indexed keywords

ENERGY DISSIPATION; PARAMETER ESTIMATION; PROBLEM SOLVING; THERMAL EFFECTS;

EID: 34548073818     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/STHERM.2007.352393     Document Type: Conference Paper
Times cited : (40)

References (12)
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  • 3
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  • 4
    • 0017454241 scopus 로고
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    • Holway, L.H., M.G. Adlerstein, "Approximate Formulas for the Thermal Resistance of IMPATT Diodes Compared With Computer Calculations", IEEE Trans on Electron Devices, Vol. 24, No. 2, pp. 156-157, 1977.
    • (1977) IEEE Trans on Electron Devices , vol.24 , Issue.2 , pp. 156-157
    • Holway, L.H.1    Adlerstein, M.G.2
  • 8
    • 0030397256 scopus 로고    scopus 로고
    • A Closed Form Solution of Junction to Substrate Thermal Resistance in Semiconductor Chips
    • Masana, F.N., "A Closed Form Solution of Junction to Substrate Thermal Resistance in Semiconductor Chips", IEEE Trans on Components, Packaging & Mfg Technology, Vol. 19, No. 4, pp. 539-545, 1996.
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    • Masana, F.N.1
  • 9
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    • The 45° heat spreading angle: An urban legend?
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    • Guenin, B.M.1
  • 10
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    • Enhancing Reliability with Thermal Transient Testing
    • Székely, V., "Enhancing Reliability with Thermal Transient Testing", Microelectronics Reliability, Vol. 42, No. 4-5, pp. 629-640, 2002.
    • (2002) Microelectronics Reliability , vol.42 , Issue.4-5 , pp. 629-640
    • Székely, V.1
  • 12
    • 33846624281 scopus 로고    scopus 로고
    • Influence of Substrate Thickness on Thermal Impedance of Microelectronic Structures
    • in press, doi:10.1016/j.microrel.2006.05.017
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.