Temperature distribution and short circuit events in IGBT-modules used in traction inverters

IEEE International Symposium on Industrial Electronics

Volumn , Issue , 2007, Pages 799-804

  Perpiñà, Xavier ^a   Castellazzi, Alberto ^b   Piton, Michel ^a   Lourdel, Guillaume ^a   Mermet Guyennet, Michel ^a   Rebollo, José ^c  

^a ALSTOM   (France)

^b ETH ZURICH   (Switzerland)

^c INSTITUTO DE MICROELECTRÓNICA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FAULT LOCATION; ELECTRONICS INDUSTRY; INDUSTRIAL ELECTRONICS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); TECHNICAL PRESENTATIONS; TEMPERATURE DISTRIBUTION; THERMOANALYSIS; THERMOSTATS; TRACTION (FRICTION); WELDS;

COMPACT MODELING; INTERNATIONAL SYMPOSIUM; PACKAGE PARASITICS; RAILWAY TRACTIONS; REALISTIC OPERATIONAL CONDITIONS; SHORT CIRCUIT;

ACTIVE FILTERS;

EID: 50049113615     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIE.2007.4374699     Document Type: Conference Paper

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