Transmission electron microscopy (TEM) of Earth and planetary materials: A review

Mineralogical Magazine

Volumn 74, Issue 1, 2010, Pages 1-27

  Lee, M R ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Electron diffraction; Electron energy loss spectroscopy; Focused ion beam; Transmission electron microscopy

Indexed keywords

ATOMIC-RESOLUTION; ATOMIC-RESOLUTION IMAGING; CHEMICAL DAMAGES; CHEMICAL IMAGING; ELECTRON CRYSTALLOGRAPHY; FAST ELECTRONS; FOCUSED ION BEAM TECHNIQUE; GEOSCIENTISTS; HIGH INTENSITY BEAM; HIGH-ANGLE ANNULAR DARK FIELDS; NANOMETRES; NATURAL MATERIALS; NEW TECHNOLOGIES; PLANETARY MATERIALS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SITE-SPECIFIC; SPATIAL RESOLUTION; SPECTRUM MAPPING; TEM; TRANSMISSION ELECTRON MICROSCOPE; Z-CONTRAST IMAGING;

ATOMIC SPECTROSCOPY; DISSOCIATION; ELECTRON DIFFRACTION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPES; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; FOCUSED ION BEAMS; IONS; NUCLEAR INSTRUMENTATION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

IMAGING METHOD; MINERALOGY; SCANNING ELECTRON MICROSCOPY; SPATIAL RESOLUTION; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION;

EID: 77951811804     PISSN: 0026461X     EISSN: 14718022     Source Type: Journal    
DOI: 10.1180/minmag.2010.074.1.1     Document Type: Review

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