Bonding in silicates: Investigation of the Si L2,3 edge by parallel electron energy-loss spectroscopy

American Mineralogist

Volumn 84, Issue 5-6, 1999, Pages 946-964

  Garvie, Laurence A J ^a   Buseck, Peter R ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; BAND STRUCTURE; BINDING ENERGY; CALCULATIONS; CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL CHEMISTRY; DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ENERGY DISSIPATION; FELDSPAR; GEOMETRY; GLASS; IRON COMPOUNDS; MAGNETIC CORES; MIXING; MOLECULAR ORBITALS; NANOCRYSTALLINE MATERIALS; PLASMA DIAGNOSTICS; POLYMERIZATION; POSITIVE IONS; QUARTZ; SILICATES; TOPAZ; TRANSMISSION ELECTRON MICROSCOPY; ZIRCON;

BAND STRUCTURE CALCULATION; ENERGY LOSS NEAR EDGE STRUCTURE; ISOTROPIC CHEMICAL SHIFTS; LINEAR CORRELATION; MODIFYING PARAMETERS; NEAREST-NEIGHBOR INTERACTIONS; PARALLEL ELECTRON ENERGY LOSS SPECTROSCOPIES; PARTIAL DENSITY OF STATE;

SILICON;

CRYSTAL CHEMISTRY; CRYSTAL STRUCTURE; SILICATE;

EID: 0032723949     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-1999-5-631     Document Type: Article

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