Accurate and precise lattice parameters by selected-area electron diffraction in the transmission electron microscope

American Mineralogist

Volumn 94, Issue 5-6, 2009, Pages 793-800

  Mignaioli, Enrico ^a   Capitani, Giancarlo ^b,e   Nieto, Fernando ^c   Mellini, Marcello ^d  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b UNIVERSITY OF BARI   (Italy)

^c CSIC   (Spain)

^d UNIVERSITY OF SIENA   (Italy)

^e UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

Electron diffraction; Elliptical distortion; Lattice parameters; Mica

Indexed keywords

ELECTRONS; GOLD METALLOGRAPHY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LATTICE CONSTANTS; METAMORPHIC ROCKS; MICA; TRANSMISSIONS;

BASAL SPACING; BEAM DAMAGE; CONSTANT CONDITIONS; CURRENT FLOWING; EXPECTED VALUES; GOLD NANOCRYSTALS; SELECTED AREA ELECTRON DIFFRACTION;

ELECTRON DIFFRACTION;

CRYSTAL CHEMISTRY; CRYSTAL STRUCTURE; GOLD; LATTICE DYNAMICS; METAMORPHIC ROCK; MICA; QUARTZ; TRANSMISSION ELECTRON MICROSCOPY; VESUVIANITE;

MICAS;

EID: 68549117165     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2009.2994     Document Type: Article

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