Focused Ion Beam (FIB) combined with SEM and TEM: Advanced analytical tools for studies of chemical composition, microstructure and crystal structure in geomaterials on a nanometre scale

Chemical Geology

Volumn 261, Issue 3-4, 2009, Pages 217-229

  Wirth, Richard ^a  

^a GFZ GERMAN RESEARCH CENTRE FOR GEOSCIENCES   (Germany)

Author keywords

Chemical composition; Crystal structure; FIB; SEM; TEM

Indexed keywords

CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; MICROSTRUCTURE; SAMPLE PREPARATION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 63449083752     PISSN: 00092541     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chemgeo.2008.05.019     Document Type: Article

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