Transmission electron microscopy without aberrations: Applications to materials science

Current Applied Physics

Volumn 8, Issue 3-4, 2008, Pages 425-428

  Kirkland, Angus ^a   Chang, Lan Yun ^a   Haigh, Sarah ^a   Hetherington, Crispin ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Aberration correction; Exit wave reconstruction; Nanocrystalline catalysis

Indexed keywords

ABERRATIONS; CATALYSTS; MATERIALS SCIENCE; NANOCRYSTALLINE MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION CORRECTION; EXIT WAVE RECONSTRUCTION; NANOCRYSTALLINE CATALYSIS;

OPTICAL CORRELATION;

EID: 38649130177     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2007.10.065     Document Type: Article

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