Preparation of TEM samples by focused ion beam (FIB) techniques: Applications to the study of clays and phyllosilicates in meteorites

Mineralogical Magazine

Volumn 67, Issue 3, 2003, Pages 581-592

  Lee, M R ^a   Bland, P A ^b   Graham, G ^b  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

^b OPEN UNIVERSITY   (United Kingdom)

Author keywords

Carbonaceous chondrite; Cronstedtite; Focused ion beam; TEM; Weathering

Indexed keywords

CLAY; CRYSTALS; ELECTRONS; METEORITES; PRECIPITATION (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY;

ION MILLING;

ION BEAMS;

ALLAN HILLS METEORITE; CARBONACEOUS CHONDRITE; CLAY MINERAL; PHYLLOSILICATE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0041346101     PISSN: 0026461X     EISSN: None     Source Type: Journal    
DOI: 10.1180/0026461036730119     Document Type: Article

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